Overview

Gender

male

Larry D. Smith is a Principal Signal Integrity engineer at Micron specializing in Power Integrity since August 2018. Prior to joining Micron, he was a PI engineer at Qualcomm in the mobile computing space beginning in 2011. He worked at Altera from 2005 to 2011 and Sun Microsystems from 1996 to 2005, where he did development work in the field of signal and power integrity. Before this, he worked at IBM in the areas of reliability, characterization, failure analysis, power supply and analog circuit design, packaging, and signal integrity. Mr. Smith received the BSEE degree from Rose-Hulman Institute of Technology and the MS degree in material science from the University of Vermont. He has more than a dozen patents and has authored numerous journal and conference papers. His most recent work is a book entitled “Principles of Power Integrity for PDN Design” published by Prentice Hall in 2017.